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[mitsubishi_cn105] Fix test grouping conflict with uart package (#15366)

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J. Nick Koston authored and GitHub committed 2026-04-02 09:12:38 -04:00
1 parent 34295fbd69
commit c21c7dd292
3 files changed
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tests/components/mitsubishi_cn105/test.esp32-idf.yaml
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packages:
uart: !include ../../test_build_components/common/uart_9600_even/esp32-idf.yaml
uart_9600_even: !include ../../test_build_components/common/uart_9600_even/esp32-idf.yaml
<<: !include common.yaml
tests/components/mitsubishi_cn105/test.esp8266-ard.yaml
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@@ -1,4 +1,4 @@
packages:
uart: !include ../../test_build_components/common/uart_9600_even/esp8266-ard.yaml
uart_9600_even: !include ../../test_build_components/common/uart_9600_even/esp8266-ard.yaml
<<: !include common.yaml
tests/components/mitsubishi_cn105/test.rp2040-ard.yaml
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@@ -1,4 +1,4 @@
packages:
uart: !include ../../test_build_components/common/uart_9600_even/rp2040-ard.yaml
uart_9600_even: !include ../../test_build_components/common/uart_9600_even/rp2040-ard.yaml
<<: !include common.yaml